EL cell defect segmentor
CNN (YOLOv8-seg)
Pixel-mask cracks, finger interruptions, dark areas in EL images.
in 1024² 16-bit EL frame
out defect masks + class · per-cell score
cadence per module (≈1 s)
Cell A/B/C grader
ViT-B/16
Grades each cell A/B/C from a 224² EL crop using a fine-tuned ViT.
in 224² EL crop
out softmax(grade) · embedding[768]
cadence per cell
Sub-50 µm microcrack detector
ViT-S + heatmap
Detects hairline cracks invisible to YOLO seg head.
in EL crop · PL crop
out crackP · saliency heatmap
cadence per cell
Busbar / finger continuity
U-Net++
Segments grid lines; flags broken fingers > 3 segments.
in EL frame
out finger-break count · severity
cadence per cell
Soldering joint inspector
Mask R-CNN
Locates ribbon-to-busbar joints; classifies cold/over-soldered.
in RGB stringer overhead
out joint-class · ΔT estimate
cadence per string
Lamination · Final Inspection Lamination bubble / delamination detector
EfficientNet-B3 + U-Net seg
Detects EVA outgassing bubbles, edge delam, and trapped-air blisters from backlit RGB and EL signature (dark core + bright fringe). Drives bubbleRisk per module.
in Backlit RGB · EL frame
out bubble-area % · bbox · per-cell bubbleRisk · root-cause hint
cadence per module (≈400 ms)
TCO scratch / pinhole
ResNet-50 + Grad-CAM
Surface defects on ITO/IWO after sputter.
in Reflective RGB
out defect class · attention map
cadence per wafer
EL synthetic augmentation
Diffusion + ControlNet
Generates rare-defect EL images to balance training.
in defect prompt · seed mask
out synthetic EL set
cadence offline
Edge-chipping detector
DETR
Cell edge / corner chip localisation pre-stringer.
in Edge-illum RGB
out chip bbox · mm-size
cadence per cell
Wafer TTV / bow estimator
Hough + CNN
Total-thickness-variation and bow from optical interferometry.
in fringe pattern
out TTV µm · bow µm
cadence per wafer
Lot-to-lot drift visual diff
Siamese CNN
Pairwise similarity between current EL batch and golden lot.
in EL batch
out drift score 0..1
cadence hourly
Wafer ID / DataMatrix reader
OCR (TrOCR-fine)
Reads laser-engraved IDs; ties EL → recipe → operator.
in wafer corner crop
out ID string · confidence
cadence per wafer
Unknown-defect novelty
Self-supervised (DINOv2)
Open-set: flags EL features the labelled classifier has not seen.
in EL embedding
out novelty score
cadence per cell
Glass surface 3D scan
PointNet++
Detects pre-lamination glass scratches > 30 µm.
in laser triangulation cloud
out scratch list
cadence per glass
Conveyor jam detector
Optical-flow CNN
Compares expected vs actual cell motion.
in fixed-cam video
out jamP · location
cadence 10 Hz
Stringer ribbon-misalignment
ConvNeXt
Side-cam ribbon offset > 0.3 mm flag.
in side RGB
out Δx mm · class
cadence per string
PL anomaly reconstructor
VAE
Reconstruction-error anomaly on photoluminescence images.
in PL frame
out anomaly map
cadence per cell
Lamination press temperature plume
CNN-LSTM
IR thermography time-series → uniformity index.
in IR video
out ΔT field · uniformity
cadence per cycle
Sim-to-real EL bridge
GAN style-transfer
Aligns simulated EL to factory camera domain for training.
in synthetic EL
out domain-adapted EL
cadence offline
Junction-box solder inspect
Capsule-Net
Verifies junction-box ribbon soldering geometry.
in macro RGB
out OK/NOK · pose
cadence per module
EVA cure/colour inspector
CNN + UV illum
UV-fluorescence based EVA cross-link estimate.
in UV RGB
out cure %
cadence per module
Frame-bond bead profile
Stereo-CNN
3D bead width/height vs spec for module framing.
in stereo RGB
out bead WxH mm
cadence per module