Andon
Severity-ranked alert wall · Bayesian root-cause attribution · station heatmap
M45M44M43M82M58
Open alerts
6
2 un-acked
Critical / High
3
hard breach
Medium / Low
3
watch / drift
Info
0
advisory
Active faults
1
injected disturbances
MTTA
1.5 min
time-to-ack
MTTR
15.2 min
time-to-clear
Alert volume · last 60 sim minutes
M43Likely root causes (Bayesian)
M45M44
Δ vs nominal: Voc -0.0 mV · Pmax -0.04 W · FF -0.00 pp · crack +49.5%
| Candidate cause | Subsystem | Posterior |
|---|---|---|
| #1PECVD i-layer thinning (epi onset) | PECVD | 0.0% |
| #2PECVD i-layer overgrowth | PECVD | 0.0% |
| #3PECVD chamber temperature drift +25°C | PECVD | 0.0% |
| #4PECVD RF power excursion | PECVD | 0.0% |
| #5H2 dilution out-of-band (low) | PECVD | 0.0% |
| #6TCO target poisoning | TCO | 0.0% |
Station × severity heatmap · open alerts
Active disturbances
- RCA-1 bath under-temperature 6 °Ct=410.0rca-cold· cleaning· duration 35 min62%
CRITICAL · 1
CRITICALt=281.0
Vacuum pump 1 pressure spike → 47 mbar (target ≤ 8)
station: lamination
Switch to standby pump and isolate primary
HIGH · 2
HIGHt=315.0
Chamber 3 i-layer thickness drift −1.2 nm over 18 modules
station: pecvd
Recalibrate flow-meter F-103 and resample
HIGHt=337.0
Target life 17% — sheet resistance creeping +6 Ω/□
station: tco
Schedule target swap within 90 min
ack @ 339.0
MEDIUM · 3
MEDIUMt=442.0
Microcrack rate 2.4% over last 50 modules (band 1.0%)
station: stringing
Reduce ribbon tension by 0.3 N on Stringer-2
ack @ 444.0
MEDIUMt=86.0
Peak temperature −4 °C from setpoint (zone 2)
station: curing
Inspect zone-2 IR emitter array
ack @ 88.0
MEDIUMt=206.0
RCA-2 bath age 28 h — Dit baseline drifting
station: cleaning
Refresh chemistry, log new baseline
ack @ 208.0
Recently cleared · 8
- t=199.0infoFPY 96.8% (24h), trending +0.4 ppcleared @ 213.2
- t=301.0infoChamber 1 PM scheduled in 14 h (300 h cumulative)cleared @ 308.3
- t=204.0infoITO targets at 4/8 — within reorder envelopecleared @ 209.9
- t=325.0infoPlant kWh/module +3.4% vs 24h baselinecleared @ 360.0
- t=327.0lowCure α at vacuum release 0.41 (band ≥ 0.45)cleared @ 332.3
- t=369.0lowO₂/Ar ratio 2.18 (band 1.5–2.5)cleared @ 382.8
- t=235.0lowSolder iron 3 dwell variance ↑ 12%cleared @ 241.1
- t=108.0lowFinger width avg 33 µm (target 30)cleared @ 142.3