Defect Genealogy
Cluster module · mod_cluster_stringer1_004
Module
mod_cluster_stringer1_004
Defect 102 (Scrap)
Final Pmax
497 W
545 min total
Tier
Scrap
defects 102
Module 4 of 8 in cluster cluster_stringer1_0835_excursion. Defect 102 (Scrap-tier). Bayesian signature match 78% with cluster cause. Outside-wire crack, A-tier limit exceeded.
Genealogy timeline · click any event for detail
WaferCell-sideModule-sideParameter ΔAlertsRecommendationsInspectionsDefectsDefect cards red-bordered · solid lines = direct causation
SPC charts · Vasu's monitoring framework
String Tension · Stringer 1
CUSUM chart
warn 4.5 · action 4.8 N
Tension drifted from 4.2 to 4.7 N at 08:35. CUSUM warning crossed at 08:48; action threshold at 09:18 when operator reverted. This module processed at 08:53 in the middle of the window.· Green dashed: If tension recommendation accepted at 08:50.
Counterfactual overlay — what should have happened
Toggle to overlay the alternate timeline branch where the platform's recommendations were accepted at the right moment.
Bayesian attribution · 1 chain
102 Crack cell outside wire
top confidence 78%
Stringer 1 excursion78% · sig 78%
Other / unattributed22% · sig 0%
Blast radius · 1 cluster
cluster_stringer1_0835_excursion
Stringer 1 Tension Excursion · 08:35–09:18
8 modsdefects: 7clean: 1sig 76%
RIL 101 × 4RIL 102 × 3
Cell provenance · 72 cells
Each cell carries its full station-visit history. Click a cell to inspect recipe snapshots and per-station measurements.
Module outcome
Final classification
Scrap
Economic impact
Cost basis $156 · Recovery $0
Counterfactual recovery
~$1,360 avoided
This page demonstrates full provenance for three showcase modules AND their full cluster genealogies — 53 additional cluster modules whose journeys share the same upstream causal events as the showcases. In production deployment, every module's complete genealogy and every cluster's full membership is tracked automatically. This demonstration shows what that looks like at the cluster scale.