Defect Genealogy
Full provenance — wafer arrival to final inspection
Module
mod_showcase_crack_001
Defect 101 (Crack cell middle, Scrap)
Final Pmax
487 W
568 min total
Tier
Scrap
defects 101
This module shows defect 101 (Crack cell middle, Scrap tier). Bayesian root cause: 87% posterior on Stringer 3 tension excursion at 14:32, which the operator declined to address.
Genealogy timeline · click any event for detail
WaferCell-sideModule-sideParameter ΔAlertsRecommendationsInspectionsDefectsDefect cards red-bordered · solid lines = direct causation
SPC charts · Vasu's monitoring framework
String Tension · Stringer 3
CUSUM chart
warn 4.5 · action 4.8 N
Operator raised tension from 4.2 → 4.8 N at 14:32. CUSUM warning crossed at 14:35 and action threshold at 15:08. This module passed through Stringer 3 at 14:42, in the middle of the excursion.· Green dashed: If recommendation accepted at 14:38.
Soldering Temperature · Stringer 3
I-MR chart
warn 250 · action 260 °C
Soldering iron held nominal throughout the shift; no thermal contribution to the defect.
Cell Microcrack Rate · Stringer 3
p-chart
warn 0.02 · action 0.04 proportion
Per-lot crack rate from EL screening of cells exiting Stringer 3 spiked from 0.5% to 3.8% during the tension excursion before recovering once tension reverted.
Counterfactual overlay — what should have happened
Toggle to overlay the alternate timeline branch where the platform's recommendations were accepted at the right moment.
Bayesian attribution · 1 chain
101 Crack cell middle
top confidence 87%
Stringer 3 tension excursion (14:32–15:08)87% · sig 92%
Incoming wafer thickness (S-2 thin batch)9% · sig 41%
PECVD Chamber 7 minor drift3% · sig 12%
Other / unattributed1% · sig 0%
Blast radius · 1 cluster
cluster_stringer3_1432_excursion
Stringer 3 Tension Excursion · 14:32–15:08
14 modsdefects: 13clean: 1sig 76%
RIL 101 × 7RIL 102 × 6
Cell provenance · 72 cells
Each cell carries its full station-visit history. Click a cell to inspect recipe snapshots and per-station measurements.
Module outcome
Final classification
Scrap
Economic impact
Cost basis $156 · Recovery $0
Counterfactual recovery
~$170 avoided
This page demonstrates full provenance for three showcase modules AND their full cluster genealogies — 53 additional cluster modules whose journeys share the same upstream causal events as the showcases. In production deployment, every module's complete genealogy and every cluster's full membership is tracked automatically. This demonstration shows what that looks like at the cluster scale.